2013 Annual Silicon Valley Test Workshop

2013 Archive of Presentations

For a description of the presentations, please see the Program Schedule.

• A Fine Pitch MEMS Probe Card
  Florent Cross, Advantest
  Gary Maier, International Business Machines
   
• Security for Chips
  Jennifer Dworak, SMU
  Al Crouch, Asset
   
• Testing a Programmable SOC
  Albert Alcorn, Cypress Semiconductor
   
• CloudTesting Service Revolutionary New Concept For Post-Silicon Validation
  Angari Sivaram, Cloud Testing Service
   
• VRT: The Test Escape You Cannot Escape From? True or False
  Craig Soldat, Berkley Consulting
   
• Adopting the PXI Architecture for Semiconductor Test Applications
  Dale Johnson, Marvin Test Solutions
   
• PA and FEM manufacturing and beyond. Test Achievements and test challenges.
  Gennady Farber, Agilent Technologies
   
• Strategies to Eliminate Counterfeit IC’s
  Joe Holt, Integra Technologies
   
• Trends, Challenges, and Solutions in Advanced SoC Wafer Probe
  Mike Slessor, FormFactor
  Amy Leong, FormFactor
   
• Optimizing High Performance in Test Sockets with Configuration Designs (unavailable)
  Gert Hohenwater, GateWave Northern
   
• Advanced Characterization Techniques for RF Components
  Chris Ziomek, LitePoint
   
• Contactor Design and Deployment for Strip Test
  Jon Diller, Smiths Connectors 

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